Microelectronics Journal

期刊简介：Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.

【译文】自1969年出版以来，《微电子学杂志》是一个国际论坛，用于传播微电子系统、电路和新兴技术的研究与应用。发表在《微电子学杂志》上的论文都经过同行评审，以确保原创性、相关性和时效性。因此，该杂志为全球提供了关于微电子电路和系统的定期、全面更新。本杂志欢迎描述以下所有领域的重要研究和应用方面的论文。涵盖最新发展的全面综述/调查论文也将被考虑。本杂志涵盖电路和系统。这一主题包括但不限于：模拟、数字、混合和射频电路及其相关设计方法；逻辑、架构和系统级综合；测试、可测试性设计、内置自检；面积、功率和热分析及设计；混合域模拟和设计；嵌入式系统；非冯·诺依曼计算及其相关技术和电路；高复杂性系统集成的设计和测试；SoC、NoC、SIP和NIP的设计和测试；3-D集成设计和分析；新兴器件技术和电路，如FinFETs、SETs、自旋电子学、SFQ、MTJ等。应用方面，如信号和图像处理，包括密码学电路、传感器和执行器，包括传感器网络、可靠性和质量问题以及经济模型也是欢迎的。