Microelectronics Reliability

期刊简介：Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.

【译文】《微电子可靠性》致力于传播关于微电子器件、电路和系统可靠性的最新研究成果及相关信息，涵盖从材料、工艺和制造到设计、测试和运行的各个方面。该期刊涵盖以下主题：测量、理解和分析；评估和预测；建模和仿真；方法和缓解。同时欢迎结合可靠性与其他微电子工程重要领域的论文，如设计、制造、集成、测试和现场运行，以及特别鼓励报道该领域和特定应用领域的案例研究的实际论文。大多数被接受的论文将以研究论文的形式发表，描述重大进展和已完成的工作。关于一般兴趣的重要发展主题的综述论文也可能被接受发表。更初步的紧急通讯和关于当前感兴趣已完成实际工作的简报也可能被考虑发表为研究简报。所有投稿都将由该领域的领先专家进行同行评审。