IEEE Transactions on Device and Materials Reliability

译名:IEEE 器件与材料可靠性汇刊

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

EISCIEJCR Q3

1-3

2026

影响因子区间

58天

平台估算

投稿周期

51%

2025

中国作者发文占比

USD 3,290

费用说明

收费

期刊简介:The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.

【译文】该期刊的范围包括但不限于:设备、材料、工艺、接口、集成微系统(包括MEMS和传感器)、晶体管、技术(CMOS、BiCMOS等)、集成电路(IC、SSI、MSI、LSI、ULSI、ELSI等)、薄膜晶体管应用。从概念阶段到研发和制造规模化的每个阶段,对这些实体可靠性的测量和理解,为成功将产品引入市场提供了关于设备、材料、工艺、封装和其他必要性的整体可靠性数据库。这个可靠性数据库是高质量产品的基石,满足客户期望。这样开发的产品具有高可靠性。高质量将得到实现,因为产品中的弱点将被发现(根本原因分析)并从最终产品中设计出来。这种不断增长的可靠性和质量将导致更优质的产品。最终,可靠性和质量不是一回事;但在某种程度上,一切可以或必须做的事情都是为了确保产品在客户条件下成功地在现场运行。

出版社
Institute of Electrical and Electronics Engineers
语言
English
学科
工程技术
ISSN
1530-4388
eISSN
1558-2574
出版频率
季刊
创刊年份
1968
投稿网址
http://mc.manuscriptcentral.com/tdmr
最近更新
2026-04-02 18:16:40
IEEE Transactions on Device and Materials Reliability

指标当前值近三年趋势
JCR分区Q3
暂无
影响因子区间1-3
暂无