Journal of Electronic Testing

期刊简介：The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics:Testing of VLSI devices printed circuit boards, and electronic systems;Testing of analog and digital electronic circuits;Testing of microprocessors, memories, and signal processing devices;Fault modeling;Test generation;Fault simulation;Testability analysis;Design for testability;Synthesis for testability;Built-in self-test;Test specification;Fault tolerance;Formal verification of hardware;Simulation for verification;Design debugging;AI methods and expert systems for test and diagnosis;Automatic test equipment (ATE);Test fixtures;Electron Beam Test Systems;Test programming;Test data analysis;Economics of testing;Quality and reliability;CAD Tools;Testing of wafer-scale integration devices;Testing of reliable systems;Manufacturing yield and design for yield improvement;Failure mode analysis and process improvement

【译文】《电子测试：理论与应用杂志》是一个国际论坛，用于传播电子测试领域的研究和应用信息。这是唯一一本专门致力于电子测试的期刊。发表在《电子测试：理论与应用杂志》上的论文将通过同行评审来确保其原创性、时效性和相关性。该期刊提供存档材料，并通过其快速出版周期，努力将最新成果带给研究人员和实践者。虽然它强调发表尚未发表的重要材料，但根据编辑的判断，符合期刊同行评审标准的杰出会议论文也将被发表。此外，《电子测试：理论与应用杂志》还寻求清晰撰写的综述和评论文章，以促进对当前技术水平的深入了解。该期刊涵盖的主题包括但不限于以下内容：VLSI器件、印刷电路板和电子系统的测试；模拟和数字电子电路的测试；微处理器、存储器和信号处理设备的测试；故障建模；测试生成；故障模拟；可测试性分析；可测试性设计；可测试性综合；自检；测试规范；容错；硬件形式验证；验证仿真；设计调试；用于测试和诊断的AI方法和专家系统；自动测试设备（ATE）；测试夹具；电子束测试系统；测试编程；测试数据分析；测试经济学；质量和可靠性；CAD工具；晶圆级集成器件的测试；可靠系统的测试；制造良率和良率设计改进；故障模式和过程改进