MAPAN

期刊简介：MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology.The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.

【译文】MAPAN-印度计量学会期刊是一本季刊。它专门致力于计量学（科学、工业或法律）。通过发表关于科学、工业和法律计量学的独家文章，该期刊满足了计量学家，尤其是质量实践者的重要需求。该期刊发表关于测量科学当前兴趣的研究通讯或技术文章；任何计量学相关领域的原创工作、教程或综述论文；计量学的评论和分析研究；关于可靠性、测量不确定性的案例研究；以及相互比较和熟练度测试的报告和结果。